SPIE Proceedings [SPIE SPIE Optical Metrology - Munich,...

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SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Monday 23 May 2011)] Optical Measurement Systems for Industrial Inspection VII - New method for evaluating high-quality fog protective coatings

Czeremuszkin, Grzegorz, Latreche, Mohamed, Mendoza-Suarez, Guillermo, Lehmann, Peter H., Osten, Wolfgang, Gastinger, Kay
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Volume:
8082
Year:
2011
Language:
english
DOI:
10.1117/12.889541
File:
PDF, 4.56 MB
english, 2011
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