Total dose ionizing irradiation effects on a static random access memory field programmable gate array
Gao, Bo, Yu, Xuefeng, Ren, Diyuan, Li, Yudong, Sun, Jing, Cui, Jiangwei, Wang, Yiyuan, Li, MingVolume:
33
Language:
english
Journal:
Journal of Semiconductors
DOI:
10.1088/1674-4926/33/3/034007
Date:
March, 2012
File:
PDF, 1.20 MB
english, 2012