![](/img/cover-not-exists.png)
ECS Transactions [ECS China Semiconductor Technology International Conference 2010 (CSTIC 2010) - Shanghai, China (March 18 - March 19, 2010)] - Mechanism and Solution of Isb Failure on Deep Trench DRAM
Li, Zhi-Chao, Mo, Ting-Ting, Lin, Yi-Hui, Sun, Peng, Zhang, Jiwei, Chiu, Wen-Pin, Lin, Paul-Chang, Xing, CharlesYear:
2010
Language:
english
DOI:
10.1149/1.3360646
File:
PDF, 332 KB
english, 2010