Determination of interface states and their time constant...

Chinese Physics B 2013 / 04 Vol. 22; Iss. 4

Determination of interface states and their time constant for Au/SnO 2 /n-Si (MOS) capacitors using admittance measurements

Baran, H. M., Tataroğlu, A.
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Volume:
22
Language:
english
Journal:
Chinese Physics B
DOI:
10.1088/1674-1056/22/4/047303
Date:
April, 2013
File:
PDF, 274 KB
english, 2013
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