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Impact of Thermomechanical Stresses on Bumpless Chip in Stacked Wafer Structure
Mizushima, Yoriko, Kitada, Hideki, Uchibori, Chihiro J., Maeda, Nobuhide, Kodama, Shoichi, Kim, Youngsuk, Fujimoto, Koji, Yoshimi, Seiichi, Nakamura, Tomoji, Ohba, TakayukiVolume:
52
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.52.05FE01
Date:
May, 2013
File:
PDF, 429 KB
english, 2013