Study of Insertion Characteristics of Si Neural Probe with...

Japanese Journal of Applied Physics 2013 / 04 Vol. 52; Iss. 4S

Study of Insertion Characteristics of Si Neural Probe with Sharpened Tip for Minimally Invasive Insertion to Brain

Lee, Sanghoon, Kanno, Soichiro, Kino, Hisashi, Tanaka, Tetsu
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Volume:
52
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.52.04CL04
Date:
April, 2013
File:
PDF, 155 KB
english, 2013
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