New advances in traceability of CMMs for almost the entire...

New advances in traceability of CMMs for almost the entire range of industrial dimensional metrology needs

E. Trapet, E. Savio, L. De Chiffre
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Volume:
53
Year:
2004
Language:
english
Pages:
6
DOI:
10.1016/s0007-8506(07)60733-1
File:
PDF, 1.63 MB
english, 2004
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