New advances in traceability of CMMs for almost the entire range of industrial dimensional metrology needs
E. Trapet, E. Savio, L. De ChiffreVolume:
53
Year:
2004
Language:
english
Pages:
6
DOI:
10.1016/s0007-8506(07)60733-1
File:
PDF, 1.63 MB
english, 2004