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Effect of pulsed electric fields on dielectric breakdown in Cu damascene interconnects
Yeon, Han-Wool, Song, Jun-Young, Lim, Seung-Min, Bae, Jang-Yong, Hwang, Yuchul, Joo, Young-ChangVolume:
8
Language:
english
Journal:
Applied Physics Express
DOI:
10.7567/APEX.8.031502
Date:
March, 2015
File:
PDF, 818 KB
english, 2015