Reliability analysis and yield enhancement of resistive...

Japanese Journal of Applied Physics 2014 / 01 Vol. 53; Iss. 4S

Reliability analysis and yield enhancement of resistive random access memory with adaptive incremental step pulse programming sizing

Kim, Sang-Yun, Baek, Jong-Min, Seo, Dong-Jin, Park, Jae-Koo, Chun, Jung-Hoon, Kwon, Kee-Won
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Volume:
53
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.53.04ED15
Date:
January, 2014
File:
PDF, 249 KB
english, 2014
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