Thermal Conductivity Measurement of Molten Silicon by a...

Japanese Journal of Applied Physics 2000 / 3 Vol. 39; Iss. Part 1, No

Thermal Conductivity Measurement of Molten Silicon by a Hot-Disk Method in Short-Duration Microgravity Environments

Nagai, Hideaki, Nakata, Yoshinori, Tsurue, Takashi, Minagawa, Hideki, Kamada, Keiji, Gustafsson, Silas E., Okutani, Takeshi
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Volume:
39
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.39.1405
Date:
March, 2000
File:
PDF, 1.72 MB
english, 2000
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