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Dynamic Bias-Temperature Instability in Ultrathin SiO 2 and HfO 2 Metal-Oxide-Semiconductor Field Effect Transistors and Its Impact on Device Lifetime
Li, Ming Fu, Chen, Gang, Shen, Chen, Wang, Xin Peng, Yu, Hong Yu, Yeo, Yee-Chia, Kwong, Dim LeeVolume:
43
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.43.7807
Date:
November, 2004
File:
PDF, 711 KB
english, 2004