Plasma Diagnostics and Characterizations of Al-Doped ZnO...

Plasma Diagnostics and Characterizations of Al-Doped ZnO Films Deposited with Low Temperature Sputtering Process

Choi, Yoon S., Shim, Byeong C., Kim, Hye R., Han, Jeon G.
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Volume:
52
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.52.11NB02
Date:
November, 2013
File:
PDF, 603 KB
english, 2013
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