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Analysis of the correlation between n -value and critical current in bent multifilamentary Bi2223 composite tape based on a damage evolution model
Ochiai, S, Okuda, H, Fujimoto, M, Shin, J-K, Sugano, M, Hojo, M, Osamura, K, Oh, S S, Ha, D WVolume:
25
Language:
english
Journal:
Superconductor Science and Technology
DOI:
10.1088/0953-2048/25/5/054016
Date:
May, 2012
File:
PDF, 907 KB
english, 2012