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ECS Transactions [ECS 216th ECS Meeting - Vienna, Austria (October 4 - October 9, 2009)] - Improvement in the Device Characteristics of Tin Oxide Thin-film Transistors by Adopting Ultralow-Pressure Sputtering
Huh, Myung Soo, Yang, Bong Sop, Oh, Seungha, Won, Seok-Jun, Jeong, Jae Kyeong, Hwang, Cheol Seong, Kim, Hyeong JoonYear:
2010
Language:
english
DOI:
10.1149/1.3422588
File:
PDF, 810 KB
english, 2010