SPIE Proceedings [SPIE SPIE NanoScience + Engineering - San...

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SPIE Proceedings [SPIE SPIE NanoScience + Engineering - San Diego, California, United States (Sunday 17 August 2014)] Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII - The refractive index of non-absorbing nanofluids and applications

Postek, Michael T., García-Valenzuela, Augusto, Contreras-Tello, Humberto, Sánchez-Pérez, C., Márquez-Islas, R., Barrera, R. G.
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Volume:
9173
Year:
2014
Language:
english
DOI:
10.1117/12.2064153
File:
PDF, 1.23 MB
english, 2014
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