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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California (Sunday 21 August 2011)] Optics for EUV, X-Ray, and Gamma-Ray Astronomy V - MPR: innovative 3D free-form optics profilometer
Sironi, G., Citterio, O., Pareschi, G., Negri, B., Ritucci, A., Subranni, R., Orlandi, A., Borghi, G., Stroebel, M., Arnold, J., Widemann, R., O'Dell, Stephen L., Pareschi, GiovanniVolume:
8147
Year:
2011
Language:
english
DOI:
10.1117/12.895306
File:
PDF, 3.91 MB
english, 2011