New Direct Spectroscopic Method for Determination of...

Japanese Journal of Applied Physics 2013 / 10 Vol. 52; Iss. 10R

New Direct Spectroscopic Method for Determination of Bias-Dependent Electronic States: Hard X-ray Photoelectron Spectroscopy Under Device Operation

Yamashita, Yoshiyuki, Yoshikawa, Hideki, Chikyo, Toyohiro, Kobayashi, Keisuke
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Volume:
52
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.52.108005
Date:
October, 2013
File:
PDF, 1.50 MB
english, 2013
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