Preparation of Device-Quality $\bf Cu(In, Ga)Se_{2}$ Thin...

Japanese Journal of Applied Physics 1995 / 9 Vol. 34; Iss. Part 2, No

Preparation of Device-Quality $\bf Cu(In, Ga)Se_{2}$ Thin Films Deposited by Coevaporation with Composition Monitor

Kohara, Naoki, Negami, Takayuki, Nishitani, Mikihiko, Wada, Takahiro
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Volume:
34
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.34.l1141
Date:
September, 1995
File:
PDF, 429 KB
english, 1995
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