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SPIE Proceedings [SPIE Photonics Asia 2010 - Beijing, China (Monday 18 October 2010)] Optoelectronic Devices and Integration III - The effects of annealing temperature on structure and photoluminescence of SiC/AlN bilayer thin film
He, Xiao-xiong, Li, He-qin, Fan, Wen-bin, Do, Zhi, Zhang, Xuping, Ming, Hai, Wang, Alan XiaolongVolume:
7847
Year:
2010
Language:
english
DOI:
10.1117/12.870600
File:
PDF, 519 KB
english, 2010