Study of Novel Floating-Gate Oxide Semiconductor Memory Using Indium–Gallium–Zinc Oxide for Low-Power System-on-Panel Applications
Yamauchi, Yoshimitsu, Kamakura, Yoshinari, Isagi, Yousuke, Matsuoka, Toshimasa, Malotaux, SatoshiVolume:
52
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.52.094101
Date:
September, 2013
File:
PDF, 145 KB
english, 2013