Effect of Orientation on Surface Charge Density at...

Effect of Orientation on Surface Charge Density at Silicon-Silicon Dioxide Interface

Miura, Yoshio
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Volume:
4
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.4.958
Date:
December, 1965
File:
PDF, 513 KB
english, 1965
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