Three-Dimensional Characterization of Deuterium Implanted in Silicon Using Atom Probe Tomography
Takamizawa, Hisashi, Hoshi, Katsuya, Shimizu, Yasuo, Yano, Fumiko, Inoue, Koji, Nagata, Shinji, Shikama, Tatsuo, Nagai, YasuyoshiVolume:
6
Language:
english
Journal:
Applied Physics Express
DOI:
10.7567/APEX.6.066602
Date:
June, 2013
File:
PDF, 513 KB
english, 2013