Investigation on defect levels in CdZnTe : Al using...

Investigation on defect levels in CdZnTe : Al using thermally stimulated current spectroscopy

Nan, Ruihua, Jie, Wanqi, Zha, Gangqiang, Wang, Tao, Xu, Yadong, Liu, Weihua
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Volume:
43
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/43/34/345104
Date:
September, 2010
File:
PDF, 84 KB
english, 2010
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