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Sample Geometry Effects on Electric-Field-Induced Displacements in Piezoelectric Thin Films Measured by Atomic Force Microscopy
Okino, Hirotake, Matsuda, Hirofumi, Iijima, Takashi, Yokoyama, Shintaro, Funakubo, Hiroshi, Yamamoto, TakashiVolume:
784
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/PROC-784-C11.29
Date:
January, 2003
File:
PDF, 289 KB
english, 2003