Analytical and simulation studies for diode and triode ion...

Analytical and simulation studies for diode and triode ion beam extraction systems

Abdelrahman, M. M., Basal, N. I., Zakhary, S. G.
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Volume:
36
Language:
english
Journal:
Chinese Physics C
DOI:
10.1088/1674-1137/36/4/009
Date:
April, 2012
File:
PDF, 1.99 MB
english, 2012
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