![](/img/cover-not-exists.png)
Memory characteristics of an MOS capacitor structure with double-layer semiconductor and metal heterogeneous nanocrystals
Henan, Ni, Liangcai, Wu, Zhitang, Song, Chun, HuiVolume:
30
Language:
english
Journal:
Journal of Semiconductors
DOI:
10.1088/1674-4926/30/11/114003
Date:
November, 2009
File:
PDF, 27 KB
english, 2009