![](/img/cover-not-exists.png)
Calculation of band edge levels of strained Si/(111)Si 1– x Ge x
Jianjun, Song, Heming, Zhang, Huiyong, Hu, Xianying, Dai, Rongxi, XuanVolume:
31
Language:
english
Journal:
Journal of Semiconductors
DOI:
10.1088/1674-4926/31/1/012001
Date:
January, 2010
File:
PDF, 215 KB
english, 2010