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Thermal stability of Ag films with various interface layers
Zhang, Ziyang, Kawamura, Midori, Abe, Yoshio, Kim, Kyung HoVolume:
53
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.53.048003
Date:
April, 2014
File:
PDF, 410 KB
english, 2014