Determination of the transport properties in 4H-SiC wafers...

Chinese Physics B 2011 / 03 Vol. 20; Iss. 3

Determination of the transport properties in 4H-SiC wafers by Raman scattering measurement

Sun, Guo-Sheng, Liu, Xing-Fang, Wu, Hai-Lei, Yan, Guo-Guo, Dong, Lin, Zheng, Liu, Zhao, Wan-Shun, Wang, Lei, Zeng, Yi-Ping, Li, Xi-Guang, Wang, Zhan-Guo
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Volume:
20
Language:
english
Journal:
Chinese Physics B
DOI:
10.1088/1674-1056/20/3/033301
Date:
March, 2011
File:
PDF, 410 KB
english, 2011
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