Second Harmonic Generation in Scanning Probe Microscopy for...

Second Harmonic Generation in Scanning Probe Microscopy for Edge Localization

Hu, Xiao-Gen, Li, Yu-He, Lin, Hao-Shan, Wang, Dong-Sheng, Qi, Xin
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Volume:
28
Language:
english
Journal:
Chinese Physics Letters
DOI:
10.1088/0256-307X/28/4/043402
Date:
April, 2011
File:
PDF, 914 KB
english, 2011
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