New aspects of HCI test for ultra-short channel n-MOSFET...

Chinese Physics 2006 / 11 Vol. 15; Iss. 11

New aspects of HCI test for ultra-short channel n-MOSFET devices

Xiao-Hua, Ma, Yue, Hao, Jian-Ping, Wang, Yan-Rong, Cao, Hai-Feng, Chen
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Volume:
15
Language:
english
Journal:
Chinese Physics
DOI:
10.1088/1009-1963/15/11/047
Date:
November, 2006
File:
PDF, 740 KB
english, 2006
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