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Ion Beam Analysis of the Annealing Behavior of Helium in Ti Films
Zhi-Jiang, He, Li-Qun, Shi, Chao-Zhuo, Liu, Lei, Zhang, Yong-Fang, Lu, Bin, ZhangVolume:
26
Language:
english
Journal:
Chinese Physics Letters
DOI:
10.1088/0256-307X/26/4/042501
Date:
April, 2009
File:
PDF, 524 KB
english, 2009