Micro-track structure analysis for 100 MeV Si ions in CR-39...

Chinese Physics B 2013 / 11 Vol. 22; Iss. 11

Micro-track structure analysis for 100 MeV Si ions in CR-39 by using atomic force microscopy

Fang, Mei-Hua, Wei, Zhi-Yong, Zhang, Zi-Xia, Zhu, Li, Fu, Yu, Shi, Miao, Li, Guang-Wu, Guo, Gang
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Volume:
22
Language:
english
Journal:
Chinese Physics B
DOI:
10.1088/1674-1056/22/11/116105
Date:
November, 2013
File:
PDF, 307 KB
english, 2013
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