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Oxygen Dispersive Diffusion Induced Bias Stress Instability in Thin Active Layer Amorphous In–Ga–Zn–O Thin-Film Transistors
Jeong, Jaewook, Lee, Gwang Jun, Kim, Joonwoo, Kim, Junghye, Choi, ByeongdaeVolume:
6
Language:
english
Journal:
Applied Physics Express
DOI:
10.7567/APEX.6.031101
Date:
March, 2013
File:
PDF, 5.04 MB
english, 2013