Pattern imprinting in deep sub-micron static random access memories induced by total dose irradiation
Zheng, Qi-Wen, Yu, Xue-Feng, Cui, Jiang-Wei, Guo, Qi, Ren, Di-Yuan, Cong, Zhong-Chao, Zhou, HangVolume:
23
Language:
english
Journal:
Chinese Physics B
DOI:
10.1088/1674-1056/23/10/106102
Date:
October, 2014
File:
PDF, 1015 KB
english, 2014