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[IEEE 2014 5th IEEE International Conference on Software Engineering and Service Science (ICSESS) - Beijing, China (2014.6.27-2014.6.29)] 2014 IEEE 5th International Conference on Software Engineering and Service Science - Analyzing the significance of process metrics for TT&C software defect prediction
Xia, Ye, Yan, Guoying, Zhang, HuiyingYear:
2014
Language:
english
DOI:
10.1109/ICSESS.2014.6933517
File:
PDF, 150 KB
english, 2014