Residual Stress Analysis Around Foreign Object Damage Using...

Materials Science Forum 2006 Vol. 524-525

Residual Stress Analysis Around Foreign Object Damage Using Synchrotron Diffraction

Frankel, P., Ding, Jian, Preuss, Michael, Byrne, Jim, Withers, Philip J.
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Volume:
524-525
Year:
2006
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.524-525.291
File:
PDF, 559 KB
english, 2006
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