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Laser SEU sensitivity mapping of deep submicron CMOS SRAM
Yu, Yongtao, Feng, Guoqiang, Chen, Rui, Han, JianweiVolume:
35
Language:
english
Journal:
Journal of Semiconductors
DOI:
10.1088/1674-4926/35/6/064011
Date:
June, 2014
File:
PDF, 180 KB
english, 2014