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SPIE Proceedings [SPIE Optical Systems Design - Glasgow, Scotland, United Kingdom (Monday 1 September 2008)] Advances in Optical Thin Films III - Measurement of optical constants of thin films by non conventional ellipsometry, photothermal deflection spectroscopy and plasmon resonance spectroscopy
Krasilnikova Sytchkova, Anna, Kaiser, Norbert, Lequime, Michel, Macleod, H. AngusVolume:
7101
Year:
2008
Language:
english
DOI:
10.1117/12.797660
File:
PDF, 366 KB
english, 2008