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Degradation of the front and back channels in a deep submicron partially depleted SOI NMOSFET under off-state stress
Zheng, Qiwen, Yu, Xuefeng, Cui, Jiangwei, Guo, Qi, Cong, Zhongchao, Zhang, Xingyao, Deng, Wei, Zhang, Xiaofu, Wu, ZhengxinVolume:
34
Language:
english
Journal:
Journal of Semiconductors
DOI:
10.1088/1674-4926/34/7/074008
Date:
July, 2013
File:
PDF, 420 KB
english, 2013