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SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, USA (Saturday 2 February 2013)] Oxide-based Materials and Devices IV - Control of the point defects in oxide materials to enhance functionalities in imaging

Viana, B., Maldiney, Th., Blahuta, S., Béssière, A., Gourier, D., Richard, C., Scherman, D., Ouspenski, V., Teherani, Ferechteh Hosseini, Look, David C., Rogers, David J.
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Volume:
8626
Year:
2013
Language:
english
DOI:
10.1117/12.2004066
File:
PDF, 1.20 MB
english, 2013
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