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SPIE Proceedings [SPIE SPIE Optics + Optoelectronics - Prague, Czech Republic (Monday 15 April 2013)] Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III - Multilayer reflective polarizers for the far ultraviolet
Larruquert, Juan I., Aznárez, José A., Rodríguez-de Marcos, Luis, Méndez, José A., Malvezzi, A. Marco, Giglia, Angelo, Miotti, Paolo, Frassetto, Fabio, Massone, Giuseppe, Nannarone, Stefano, CrescenziVolume:
8777
Year:
2013
Language:
english
DOI:
10.1117/12.2017444
File:
PDF, 446 KB
english, 2013