Analysis of Component Depth Profiles at the Interface of...

Defect and Diffusion Forum 2010 / 4 Vol. 297-301

Analysis of Component Depth Profiles at the Interface of Ti6242 Alloy and SiC, SiN Coatings after High Temperature Oxidation in Air

Galdikas, A., Rivière, Jean Paul, Moskalioviene, T., Pichon, L.
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Volume:
297-301
Language:
english
Journal:
Defect and Diffusion Forum
DOI:
10.4028/www.scientific.net/DDF.297-301.433
Date:
April, 2010
File:
PDF, 567 KB
english, 2010
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