High-resolution and easily implemented spectral measured...

High-resolution and easily implemented spectral measured system used for optical characterization of optoelectronic materials and devices

Ho, Ching-Hwa
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Volume:
43
Language:
english
Journal:
Optical Engineering
DOI:
10.1117/1.1755718
Date:
July, 2004
File:
PDF, 397 KB
english, 2004
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