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Effect of Interdot Coulomb Repulsion on Charge Transport of Parallel Two Single-Electron Transistors
Kuo, David M.-T., Li, Pei-WenVolume:
45
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.45.2881
Date:
April, 2006
File:
PDF, 162 KB
english, 2006