The extended trace identity and its application

Chinese Physics 2007 / 03 Vol. 16; Iss. 3

The extended trace identity and its application

Yu-Qin, Yao, Deng-Yuan, Chen
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Volume:
16
Language:
english
Journal:
Chinese Physics
DOI:
10.1088/1009-1963/16/3/009
Date:
March, 2007
File:
PDF, 181 KB
english, 2007
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