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[IEEE Proceedings of 13th International Conference on Pattern Recognition - Vienna, Austria (1996.08.29-1996.08.29)] Proceedings of 13th International Conference on Pattern Recognition - Statistical geometric features-extensions for cytological texture analysis
Walker, R.F., Jackway, P.T.Year:
1996
Language:
english
DOI:
10.1109/ICPR.1996.546931
File:
PDF, 480 KB
english, 1996