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Fracture patterns in thin films and multilayers
Volinsky, Alex A., Meyer, Dirk C., Leisegang, Tilmann, Paufler, PeterVolume:
795
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/PROC-795-U3.8
Date:
January, 2003
File:
PDF, 1.37 MB
english, 2003