Preparation of flat-polished specimens for...

Cement and Concrete Research 2003 Vol. 33; Iss. 4

Preparation of flat-polished specimens for SEM-backscattered electron imaging and X-ray microanalysis—importance of epoxy impregnation

K.O Kjellsen, A Monsøy, K Isachsen, R.J Detwiler
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Volume:
33
Year:
2003
Language:
english
Pages:
6
DOI:
10.1016/s0008-8846(02)01029-3
File:
PDF, 427 KB
english, 2003
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