[IEEE 2015 16th Latin-American Test Symposium (LATS) -...

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[IEEE 2015 16th Latin-American Test Symposium (LATS) - Puerto Vallarta, Mexico (2015.3.25-2015.3.27)] 2015 16th Latin-American Test Symposium (LATS) - Using only redundant modules with approximate logic to reduce drastically area overhead in TMR

Gomes, Iuri A. C., Martins, Mayler, Reis, Andre, Kastensmidt, Fernanda Lima
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Year:
2015
Language:
english
DOI:
10.1109/LATW.2015.7102522
File:
PDF, 406 KB
english, 2015
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